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Acquisition of Jeol JSM-6010LA SEM with EDS

Jeol InTouchScope JSM-6010LA Scanning Electron Microscope

Metairie, LA — August 1, 2013 — The Fellowship of Orthopaedic Researchers is pleased to announce the acquisition of a Jeol InTouchScope JSM-6010LA Scanning Electron Microscope with an integrated energy dispersive X-ray spectroscopy (EDS) analyzer. Through the generosity of the Marshall Heritage Foundation, FOR was able to acquire a high-performance, multi-touch screen SEM to build upon FOR’s extensive orthopaedic research, development, and testing capabilities.

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that can be detected and that contain information about the sample’s surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam’s position is combined with the detected signal to produce an image.

In the newly acquired system, surface structures can be examined through secondary electrons, distribution of materials in a specimen observed by backscattered electrons, and elements analyzed by EDS. The EDS detector analyzes the elements in the specimen and quantitatively calculates the concentration of elements, and integrated software allows the production of elemental maps to show the distribution of elements. In addition to analyzing conductive specimens, the InTouchScope JSM-6010LA is capable of transitioning between high and low vacuum modes to allow usage of low or high voltages for observation and analysis of uncoated, non-conductive specimens.

The new InTouchScope JSM-6010LA is capable of being operated by touch screen and/or by mouse and operation knob set. The PC can be connected wirelessly and controlled via laptop or iPad. The stage navigation system (SNS) takes a snapshot image of the specimen and uses that image for navigating of a large area. Its software also has the ability to save SEM settings based on sample type, for future navigation and use.

Further capabilities include:

  • Automatic SEM condition set-up based on sample type
  • Simultaneous multiple live image and movie capture
  • Easy sample navigation at 5x – 300,000x magnifications
  • Quantitative and qualitative elemental analysis
  • Low and high vacuum operation
  • Wireless capability

Click here for additional information about the JSM-6010LA.

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